This international symposium will continue its almost 30-year history of focusing on the latest research developments and future directions in failure analysis, quality and reliability of materials, devices and circuits for micro-, opto-, power and space electronics. It historically provides an unpaired European forum to develop all aspects of reliability, including management and advanced analysis techniques for present and emerging semiconductor applications. Hence, all aspects of specification, technology and manufacturing, test, control and analysis will be addressed.
This edition will be a very special one, for a couple of reasons.
First, in 2018 ESREF will celebrate its return to Denmark after exactly 20 years. It was October 1998 when the 9th ESREF was successfully organized in Copenhagen by the group of prof. Jørgen Møltoft, Technical University of Denmark – DTU. Not much material is available anymore about that event, but we were able to find the old-fashion homepage of the website and the pdf version of the program. Maybe it was not the era of deep information technology in conference organization yet, but sure it was a so impressing technical program. Have a look if you are curious!
You will find more information here.